泽尼克相衬全场X射线显微成像套件
描述全场透射x射线显微镜光学-光束整形condensers,菲涅耳波带片和泽尼克相位环的组合-材料选择:Au, Ir
- 产地: 瑞士
- 型号: 定制
- 品牌: PSI & XRnanotech
描述全场透射x射线显微镜光学-光束整形condensers,菲涅耳波带片和泽尼克相位环的组合-材料选择:Au, Ir
描述
全场透射x射线显微镜光学系统
-光束整形condensers,菲涅耳波带片和泽尼克相位环的组合
-材料选择:Au, Ir
典型参数:
大的视场 : ~80-100微米
长的工作距离: >50mm
分辨率: 50-100nm
E=6-13 KeV Zernike PC
发表文章:
I. Vartiainen et al. Halo suppression in full field X-ray Zernike phase contrast microscopy Optics Letters 39 (2014) p. 1601
M. Stampanoni et al. Hard X-ray 3D phase-contrast nanoimaging Physical Review B 81 (2010) p. 140105
I. Vartiainen et al. Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy Optics Express 23 (2015) p. 13278
I. Vartiainen et al. Zernike X-ray Ptychography Optics Letters 41 (2016) p. 721
M. Storm et al. The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences Powder Diffraction (2020) p. 1
Storm M, Döring F, Marathe S, et al. Optimizing the energy bandwidth for transmission full-field X-ray microscopy experiments[J]. Journal of Synchrotron Radiation, 2022, 29(1): 138-147.
典型参数:
大的视场:~80-100微米
长的工作距离:>50mm
分辨率:50-100nm
E=6-13 KeV Zernike PC
全场透射x射线显微镜光学
发表文章:
I. Vartiainen et al. Halo suppression in full field X-ray Zernike phase contrast microscopy Optics Letters 39 (2014) p. 1601
M. Stampanoni et al. Hard X-ray 3D phase-contrast nanoimaging Physical Review B 81 (2010) p. 140105
I. Vartiainen et al. Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy Optics Express 23 (2015) p. 13278
I. Vartiainen et al. Zernike X-ray Ptychography Optics Letters 41 (2016) p. 721
M. Storm et al. The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences Powder Diffraction (2020) p. 1