EUV/SXR/X-Ray科研级CCD相机

软X射线CCD相机-ALEX-i 成像系列

公司介绍:成立于2008年的greateyes,是以德国柏林洪堡大学的技术为基础,迅速发展成为国际知名的先进探测器生产企业。如今,其科研与工业客户群体已遍布多个国家。greateyes开发、生产并销售高性能科学相机。其作为精确探测器,被广泛应用于成像与谱学应用领域。同时,greateyes公司也生产用于太阳能产业的电致荧光与光致荧光检测系统。产品介绍:出身于柏林的ALEX是德国greateyes公

  • 产地: 德国
  • 型号: ALEX-i 1k1k、ALEX-i 2k2k、ALEX-i 2k2k plus、ALEX-i 4k4k
  • 品牌: greateyes

公司介绍:

成立于2008年的greateyes,是以德国柏林洪堡大学的技术为基础,迅速发展成为国际知名的先进探测器生产企业。如今,其科研与工业客户群体已遍布多个国家。

greateyes开发、生产并销售高性能科学相机。其作为精确探测器,被广泛应用于成像与谱学应用领域。同时,greateyes公司也生产用于太阳能产业的电致荧光与光致荧光检测系统。


产品介绍:

出身于柏林的ALEX是德国greateyes公司最新研发,应用于极紫外,真 空紫外和X射线能段的光谱及影像相机。ALEX集成了目前最前沿的低噪 声电子系统和超低温制冷技术,同时保持了紧凑小巧的设计。全新的设计 允许从50 kHz至5 MHz灵活地选择所需读出速度。18-bit 的模数转换能 够利用CCD传感器的全动态范围,以达到更好表现和更高的信噪比。为 匹配不同应用的需求,该相机包括多种类型的传感器可供用户选择。同时 ALEX的低噪声使之成为极弱信号条件下所需的理想相机,它将给您的 光谱学和影像研究带来前所未有的可能性。


ALEX-i 成像系列

用于VUV,EUV,X-ray成像


优势:

◆ 制冷温度低至-90℃;

◆ GigE & USB3.0 双数据接口;

◆ 超高真空兼容,低至10-10mbar;

◆ 量子效率高达98%;

◆ 18 bit模数转换

◆ 双读出头,四读出头


型号参数:



ALEX-i 1k1k

ALEX-i  2k2k

ALEX-i  2k2k plus

ALEX-i 4k4k

芯片类型

FI

BI
BI UV1

BI DD

FI BI

BI DD 

BI UV1

BI


BI

BI DD 

BI UV1

像素规格(标称)

1024 x 1024(FI)
1056 x 1027(others)

2048 x 2052

2048 x 2064

4096 x 4112

像素尺寸

13 μm × 13 μm

13.5 μm × 13.5 μm

15 μm × 15 μm

15 μm × 15 μm

满井容量

100 keˉ

120 keˉ

100 keˉ

150 keˉ

150 keˉ

150 keˉ

350 keˉ

读出噪声典型值(eˉ) 

@ 50 kHz
@ 1 MHz
@ 3 MHz


2.8
6.5
11.5


3.8
8.7
17.8


4.6
8.5
17.0


4.7
9.5
20.0


3.0
6.3
11.9

可调增益(counts/eˉ) Standard mode

High capacity mode


1
-


1
0.34


0.6
0.2


0.6
0.2


1
0.34

暗电流(eˉ/pixel/s)

@-100°C 

0.00015       0.0005

@-90°C
0.0001         0.001

@-90°C 

0.00008

@-90°C
0.00008           0.0006

芯片等级

Grade 0 or grade 1 (标准)



·  X 射线断层成像 

·  傅立叶变换全息图 

·  X 射线荧光透视成像 

·  相干衍射成像(CDI) 

·   电子叠层衍射(Ptychography)成像 

·  掠入射小角 X 射线散射(GISAXS)

北京众星联恒科技有限公司GE_ALEX_i成像系列_datasheet 2021-5-12.pdf


文献:

1.  P. Wachulak, M. Duda, A. Bartnik, A. Sarzyński, Ł. Węgrzyński and H. Fiedorowicz, 2-D elemental mapping of an extreme ultraviolet-irradiated PET with a compact near edge X-ray fine structure spectromicroscopy, Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 145, July 2018, Pages 107-114

2.  P. Wachulak, A. Bartnik and H. Fiedorowicz, Optical coherence tomography (OCT) with 2 nm axial resolution using a compact laser plasma soft X-ray source, Nature Scientific Reports, volume 8, Article number: 8494 (2018)

3.  P. Wachulak, M. Duda, A. Bartnik, A. Sarzyński, Ł. Węgrzyński, M. Nowak, A. Jancarek and H. Fiedorowicz, Compact system for near edge X-ray fine structure (NEXAFS) spectroscopy using a laser-plasma light source, Opt. Express 26, 8260-8274 (2018)

4.  A. Jonas, T. Meurer, B. Kanngießer and I. Mantouvalou, Reflection zone plates as highly resolving broadband optics for soft X-ray laboratory spectrometers, Review of Scientific Instruments 89, 026108 (2018)

5.  T. Pflug, J. Wang, M. Olbrich et al., Case study on the dynamics of ultrafast laser heating and ablation of gold thin films by ultrafast pump-probe reflectometry and ellipsometry, Appl. Phys. A (2018) 124: 116

6.  C. Buerhop, S. Wirsching, A. Bemm et al. Evolution of cell cracks in PV modules under field and laboratory conditions. Prog Photovolt Res Appl. 2018;26:261–272

7.  H. Stiel, J. Braenzel, A. Dehlinger, R. Jung, A. Luebcke, M. Regehly, S. Ritter, J. Tuemmler, M. Schnuerer and C. Seim, Soft x-ray nanoscale imaging using highly brilliant laboratory sources and new detector concepts, Proc. SPIE 10243, X-ray Lasers and Coherent X-ray Sources: Development and Applications, 1024309 (17 May 2017)

8.  M. F. Nawaz, M. Nevrkla, A. Jancarek, A. Torrisi, T. Parkman, J. Turnova, L. Stolcova, M. Vrbova, J. Limpouch, L. Pina and P. Wachulak, Table-top water-window soft X-ray microscope using a Z-pinching capillary discharge source, JINST, 2016, Vol. 11 PO7002

9.  I. Mantouvalou, K. Witte, W. Martyanov, A. Jonas, D. Grötzsch, C. Streeck, H. Löchel, I. Rudolph, A. Erko, H. Stiel and B. Kanngießer, Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory, Appl. Phys. Lett. 108, 201106 (2016)

10.  S. Fazinić, I. Božičević Mihalić, T. Tadić, D. Cosic, M. Jakšić, D. Mudronja, Wavelength dispersive µPIXE setup for the ion microprobe, Nucl. Instr. Meth. Phys. Res. Sec. B, 2015, Vol. 363, pages 61-65   

11.  A. Hafner, L. Anklamm, A. Firsov, A. Firsov, H. Löchel, A. Sokolov, R. Gubzhokov, and A. Erko, Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements, Opt. Express, 2015, Vol. 23, No. 23:29476-29483

12.  P. W. Wachulak, A. Torrisi, A. Bartnik, D. Adjei, J. Kostecki, L. Wegrzynski, R. Jarocki, M. Szczurek, H. Fiedorowicz, Desktop water window microscope using a double‑stream gas puff target source, Applied Physics B, 2015, 118:573–578

13.  I. Mantouvalou, K. Witte, D. Grötzsch, M. Neitzel, S. Günther, J. Baumann, R. Jung, H. Stiehl, B. Kanngießer, W. Sandner, High average power, highly brilliant laser-produced laser plasma source for soft X-ray spectroscopy, Review of Scientific Instruments, Vol. 86, Issue 3, 2015 

14.  T. Krähling, A. Michels,S. Geisler, S. Florek, J. Franzke, Investigations into Modeling and Further Estimation of Detection Limits of the Liquid Electrode Dielectric Barrier Discharge, Analytical Chemistry, 2014, 86(12), 5822-8


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