Traps 陷阱：Pixels where charge is temporarily held. Traps are counted if they have a capacity greater than 200 e− at 253 K.
Black Spot黑点：Are counted when they have a signal level of less than 80% of the local mean at a signal level of approximately half full-well.半满井条件下，计数值低于周围像素平均值的80%的像素。
White Spot白点：Are counted when they have a generation rate 125 times the specified maximum dark signal generation rate (measured between 253 and 293 K). 电子生成速率是指定的暗电流规格最大值的125倍的像素（测量温度范围253K~293K）。
列缺陷（Column defects）：A column which contains at least 50 white or 50 black defects. 一列像素黑点或白点个数多于50个。
Column defects A column which contains at least 50 white or 50 black defects.
Column defects;black or white
Traps >200 e−
Grade 5 Devices which are fully functional, with image quality below that of grade 2, and which may not meet all other performance parameters.
Note: The effect of temperature on defects is that traps will be observed less at higher temperatures but more may appear below 253 K. The amplitude of white spots and columns will decrease rapidly with temperature.
Greateyes以芯片生产商的芯片等级给出缺陷等级，通常为Grade 0或Grade 1。
上述内容由我司Jerry Huang 整理收集，仅用于知识的分享和共同学习，未经过同意不得擅自转载。