XRF analyzer crystals
Company BriefIncoatec was founded in 2002 by scientists as a spin-off of the GKSS Research Center in Geesthacht near Hamburg (today Helmholtz Center hereon GmbH) together with Bruker AXS in Karlsruhe,
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Company BriefIncoatec was founded in 2002 by scientists as a spin-off of the GKSS Research Center in Geesthacht near Hamburg (today Helmholtz Center hereon GmbH) together with Bruker AXS in Karlsruhe,
Company Brief
Incoatec was founded in 2002 by scientists as a spin-off of the GKSS Research Center in Geesthacht near Hamburg (today Helmholtz Center hereon GmbH) together with Bruker AXS in Karlsruhe, one of the leading manufacturers of X-ray Analytic Systems worldwide. Incoatec develops, produces and supplies components for X-ray analytical systems. These components include optics, mirrors, and microfocus sources for applications in x-ray diffraction, x-ray scattering, and x-ray spectrometry. Incoatec offer solutions for chemistry, pharmacy, semiconductor industry, heavy industry, life science and nanotechnology, enabling our customers to make better use of their resources and improve their results. Using extensive know-how in thin film technology together with in-house mechanical and electronic workshops, Incoatec are able to provide reliable, efficient and environment-friendly products: Made in Germany.
Introduction
XRF analyzer crystals
Optics for X-ray fluorescence spectrometry
Incoatec produces optics for X-ray Fluorescence devices.
Mirrors for XRF, TXRF and EPMA
Energy range: 0.1 - 2.3 keV
Lower limits of detection for light elements
Analysis of beryllium, boron and carbon with a 30 % improvement at a quicker rate
Special mirrors custom-made
As analyzer crystals they select the required wavelength of the fluorescence radiation emitted by the sample.
Specification
The analyzer crystals enable a distinct improvement in the lower limit of detection. The table shows results of measurements with our analyzer crystals in XRF spectrometers which are available commercially. The LLD values for light elements are calculated on the basis of typical calibration curves which were achieved by measuring different concentrations of the elements in similar kinds of samples.
Element | Sample | LLD (ppm) |
---|---|---|
Be | 4% in Cu-bronze | 685 |
B | 4% in boron-phophorus glasses | 220 |
B | 15% in colemanitis | 185 |
C | 5% in cast iron | 76 |
Applications
The analyzer optics are used for analyzing light elements such as Be, B, C, N up to S. The energy of the fluorescence radiation is filtered by the multilayers up to 2.3 keV. Our optics are for example used in XRF spectrometers made by Bruker AXS.
The XS-CEM analyzer crystal is especially designed for applications in the cement industry. It has a higher resolution and a reflectivity comparable to the PET. The main advantage of the XS-CEM is that its performance is not dependent on the temperature within the spectrometer. The PET is no longer required for many types of applications!
Downloads
XRF分析晶体 datasheet 2020.7.15.pdf