Table-top XAS system

hiXAS integrated XAFS solution

Introductionslab-based turn-key EXAFS and XANES systemsynchrotron-quality spectravery high signal to noise ratiowide bandpass of up to 1keVhiXAS offers a complete lab-based solution for Extended X-ray

  • Model: hiXAS

Company Brief

HP Spectroscopy, founded in 2012, is a leading developer and global supplier of scientific instrumentation.

The product lines include spectroscopy tools, detector solutions, and beamline instrumentation. HP Spectroscopy deliver cutting-edge products to customers in academia and industry worldwide. HP take pride in the customization of all our products to deliver the best solution for each application.

HP Spectroscopy's team consists of experts in the fields of spectroscopy, grating design, plasma physics, beamline technology, and X-ray technology, as well as mechanical, electronics, and software engineers. At HP, they combine over 70 years of expertise in spectroscopy.


  • lab-based turn-key EXAFS and XANES system

  • synchrotron-quality spectra

  • very high signal to noise ratio

  • wide bandpass of up to 1keV

hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary.

The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges.

Customized versions of hiXAS are available.

Elemental range

Range of elements accessible to hiXAS for EXAFS and XANES measurements. Even diluted samples with analyte concentrations of only a few weight percent can be measured in a time frame of several minutes.



X-ray absorption measurement of a Cu foil

Acquisition time: 3 min with sample
1.5 min without sample

C. Schlesiger et al, Recent progress in the performance of HAPG based laboratory EXAFS and XANES spectrometers

J. Anal. At. Spectrom. 35, 2298 (2020)

X-ray absorption spectrum of a 6um-thick Ni foil. Comparison to the spectrum obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000) shows the high quality results of the table-top instrument. All relevant spectral features are present, allowing for the determination of chemical compounds.


  • Chemical speciation and concentration ratios

  • Compound research

  • Short range order and bond length determination

  • Catalyst analysis


北京众星联恒科技有限公司HP-Spectroscopy_ hiXAS_datasheet_2021.10.13.pdf


  • chemical state analysis for geology, biology, materials research

  • information on atomic distances, oxidation state, coordination number

  • analysis of K-absorption edges of 3d-transition metals