Microfocus XRF

XOS fleX-Beam

Features and Benefits• fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators• Focal spot as small as 5µm @ Rh Ka (20.162keV)• 50 watt performance exceeds convention

  • Model: FLEX-BEAMS

Flexible Design, Unyielding Performance

fleX-Beam is a unique, compact X-ray generator that combines a low-powered X-ray source and a precisely aligned polycapillary optic to deliver a bright X-ray beam for advanced material analysis. It provides the turn-key solution for the end-users and ensures the X-ray optics' optimal performance. The innovative design allows seamless x-ray tube replacement and on-site optic alignment. The products have been widely used in commercial instruments for plating thickness measurement, thin-film characterizations, molecular structure analysis, and many other applications.
fleX-Beam is available in several standard focused or collimated beam configurations and can also be customized for specific applications.

Features and Benefits

• fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators
• Focal spot as small as 5µm @ Rh Ka (20.162keV)
• 50 watt performance exceeds conventional kilowatt-powered X-ray tubes
• Integrated safety shutter & 8-position filter wheel

Custom Solutions

fleX-Beam™ can be used in different applications where a compact X-ray source with high photon flux is required. Various configurations are available to be used in μ-XRF, diffraction, in-line process monitoring or in-situ analysis, and medical imaging applications. XOS provides custom fleX-Beam optics based on customer requirements.

Standard fleX-Beam Models

Simple Integration and Easy Serviceability

• This comprehensive solution is compact and easily integrates with any instrument or system

• Innovative design allows for the ability to interchange different optics, as well as service the X-ray source in the field

Applications

Micro X-ray Fluorescence (micro-XRF)

• Small Feature Analysis

• Film & Plating Thickness

• High-Resolution Elemental Mapping

• Gun residue study in forensics

• Pigment study in art preservation

• Composition and artifact analysis in archaeology


X-ray Diffraction (XRD)

• Residual Stress Analysis

• Laue Diffraction

• Powder Diffraction

Download

fleX-Beam Datasheet