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GD90 Trace-RF High-Resolution Glow Discharge Mass Spectrometer
The MSI GD90 Trace-RF is a high-resolution glow discharge mass spectrometer for direct elemental analysis of solid materials. Its double-focusing magnetic-sector analyser combines established DC glow discharge with automated RF excitation for a wider range of conductive and non-conductive samples. It covers major constituents to ultra-trace impurities and supports depth profiling of films, coatings and multilayer materials.
Model: GD90 Trace-RF
Brand: MSI
Introduction
MSI GD90 Trace RF is a high-resolution glow discharge mass spectrometer based on the GD90 Trace double-focusing magnetic-sector platform. It integrates an automated RF glow discharge system. The instrument supports both DC and RF glow discharge modes, extending established high-purity metal analysis to a broader range of advanced materials.
The GD90 Trace RF retains the GD90 Trace platform’s high mass resolving power, wide dynamic range, direct solid sampling and depth profiling capabilities. It adds flexibility for non-conductive materials. The choice of DC or RF depends on the material’s conductivity, sample form and analytical objective.
A single analysis can cover major constituents and impurities at ppm, ppb and sub-ppb levels. Applications include high-purity materials, metals and alloys, oxides, advanced inorganic materials, semiconductor materials, films, coatings and multilayer composites.
Why use RF-GDMS?
Conventional DC glow discharge requires a sample arrangement capable of sustaining a DC discharge. High-purity metals, alloys and other conductive materials are therefore typical DC-GDMS samples.
Some non-conductive samples, such as oxides, can also be analysed by DC-GDMS when mounted or pressed into a high-purity conductive carrier. This established preparation method remains useful for suitable samples.
RF glow discharge provides another option for non-conductive materials. By integrating an automated RF system into the GD90 Trace platform and retaining DC operation, MSI enables laboratories to analyse a wider range of materials on one instrument.
Direct solid analysis by high-resolution GDMS
In glow discharge mass spectrometry (GDMS), a glow discharge continuously sputters a solid sample. The sputtered atoms are ionised in the plasma, then separated and detected using a high-resolution double-focusing mass spectrometer.
GDMS analyses solid samples directly, reducing the need for wet chemical preparation and the risk of contamination or dilution associated with reagents, vessels and sample preparation. The separation of atomisation and ionisation helps limit matrix effects. Multi-element quantification can use established relative sensitivity factors (RSFs).
Core analytical capabilities
Supported materials and sample forms
The GD90 Trace RF is particularly useful in laboratories that routinely analyse both conductive and non-conductive materials.
Elemental composition as a function of depth
High-resolution mass spectrometry with flexible glow discharge
Typical applications
Key technical specifications
| Model | GD90 Trace RF |
| Analytical technique | High-resolution glow discharge mass spectrometry (HR-GDMS) |
| Mass analyser | Double-focusing magnetic-sector mass analyser |
| Glow discharge modes | DC + RF |
| Sample introduction | Direct solid sampling |
| Mass resolving power | Continuously adjustable from <400 to >10,000 RP |
| Resolution definition | 10% valley definition |
| Analytical concentration range | Major constituents to ultra-trace levels (ppb and sub-ppb) |
| Detection system | Ion counter and Faraday cup |
| Linear dynamic range | Up to 12 orders of magnitude |
| Conductive materials | DC analysis supported |
| Non-conductive materials | RF analysis or DC analysis with suitable sample preparation |
| Sample geometries | Pin, flat and other supported geometries |
| Depth profiling | Time-resolved and depth-dependent analysis |
| Quantification | RSF-based quantification |
| GD cell cooling | Optional low-temperature cooling |
About MSI
Mass Spectrometry Instruments Ltd (MSI) is a mass spectrometer manufacturer based in West Yorkshire, UK. The company specialises in the design, manufacture and support of double-focusing magnetic-sector mass spectrometers for organic and inorganic analysis.
MSI’s high-resolution mass spectrometry technology has its roots in Kratos Analytical. Kratos began introducing commercial magnetic-sector mass spectrometers in 1957. Founded in 1994, MSI has continued to develop double-focusing instruments based on this experience in magnetic-sector analysis and ion optics.
In 2010, MSI extended its high-resolution magnetic-sector technology to inorganic elemental analysis by developing glow discharge mass spectrometry (GDMS) instrumentation. High-resolution GDMS remains a core technology for MSI. The GD90 Trace platform is designed for direct elemental analysis of solids, including trace and ultra-trace impurities.
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