Rapid Screening of Thin-Film Solar Cell Materials

Industry Challenges

Low Material Analysis Efficiency: Traditional characterization methods (e.g., XRD, SEM) cannot monitor the dynamic crystallization process of thin films in real time, leading to long R&D cycles.

Difficult Process Optimization: The device performance of perovskite films is highly dependent on microstructure, yet multiple process parameters (e.g., deposition methods, annealing conditions) make it difficult to rapidly correlate structural evolution with performance.

High Screening Costs: Reliance on high-end equipment at synchrotron radiation facilities results in high testing costs and barriers, hindering large-scale industrialization.

Technological Innovation

In-situ GIWAXS Technology

Real-time Dynamic Monitoring: Using grazing-incidence wide-angle X-ray scattering, the crystallization pathways of perovskite films (e.g., cubic-to-tetragonal phase transition) are captured in situ, revealing film formation mechanisms.

Multi-dimensional Structural Analysis: By combining diffraction vector components (qz、qx、qy), in-plane and out-of-plane structural information are simultaneously obtained, enabling precise analysis of grain orientation and defect distribution.

High-throughput Data Correlation: Directly correlates microstructure with device performance (e.g., IV characteristics), accelerating process optimization.

Solution Core

Cost-effective GIWAXS System

Core Equipment: Microfocus light source and 2D area detector, supporting rapid characterization with 60-second short exposures.

Process Compatibility: Compatible with various deposition processes (spin coating, blade coating, slot-die coating, etc.) and post-treatment conditions (annealing, cooling), covering full-process in-situ characterization.

Rapid Screening Workflow: Automated data analysis software enables sample structure grading and performance prediction, improving screening efficiency by 80%.

Technical Advantages

High Resolution: Sub-nanometer structural sensitivity, capable of identifying perovskite phase transitions (e.g., MAPb3cubic and tetragonal phases).

Fast Response: Single characterization exposure takes only 60 seconds, supporting high-throughput experiments.

Low-cost Alternative: Based on laboratory-grade equipment, avoiding reliance on synchrotron radiation facilities and significantly reducing testing costs.

Process Universality: Compatible with various process scenarios, including spin coating, hot plate heating, and in-situ IV testing.

Value and Benefits

Shortened R&D Cycles: Through real-time structure-performance correlation, process optimization cycles are reduced from months to weeks.

Significant Cost Reduction: Laboratory-grade equipment for sample screening saves synchrotron radiation beamtime costs.

Accelerated Industrialization: Rapid screening of high-performance perovskite materials (e.g., MACI post-treatment of MAPb1), promoting large-scale production of stable devices.

Technological Barrier Breakthrough: Provides key data support for mechanisms such as homoepitaxial growth (e.g., Chen, 2017 case), securing patent advantages.

Application Scenarios

Perovskite Film Process Optimization

Real-time monitoring of crystallization kinetics under deposition processes such as spin coating and blade coating (e.g., Fan, 2019 case)

Analysis of phase transition pathways during annealing and cooling to guide process parameter tuning

Rapid Material Screening

High-throughput screening of the effects of additives (e.g., MACI) on structural stability (Schlipf, 2017 case)

Evaluation of film quality for different perovskite compositions (e.g., MAPb1、MAPb2)

Device Failure Analysis

Combined with in-situ IV testing, identifying efficiency degradation caused by microstructural defects (e.g., grain boundaries, voids)