One Article to Understand: Overview of X-ray Resolution Test Cards/Evaluation Phantoms (0.01-50μm, 2/3D)
Spatial resolution is an important performance indicator of CT image quality, and its testing is also an important part of CT equipment performance testing. The card method, which uses a line-pair test card to directly test spatial resolution, is widely used in practical industrial CT spatial resolution testing due to its convenience and simplicity.
Introduction
Spatial resolutionis an important performance indicator of CT image quality, and its testing is also a key part of CT equipment performance evaluation. The line-pair gauge method, which uses a line-pair test gauge to directly measure spatial resolution, is widely used in practical industrial CT spatial resolution testing due to its convenience and simplicity.
Top Unistar can provide various types of X-ray resolution test gauges/evaluation patterns, which are ideal tools for quality control and performance evaluation of X-ray imaging systems. Pattern types include line pairs, hole arrays, and Siemens stars, among others. The minimum pattern size is as low as 10 nm. For high-resolution X-ray applications up to ~300 kV and beyond, we can provide gold absorbers up to 4 μm thick to meet the testing requirements of high-energy, high-resolution X-ray imaging systems.
In addition, we can also provide:
- Phantoms for nano-CT voxel calibration - Voxel-spirit enables fast and intuitive voxel size calibration, and Voxel-spirit can even meet strict field of view (FOV) limitations and high-precision requirements.
- The Resolution-spirit universal phantom set, compliant with ASTM E1695-95, is suitable for precise three-dimensional spatial resolution evaluation of nano-CT and micro-CT. It is applicable to variable field-of-view limitations and high-precision requirements.
- The sample holder with fiducial markers for nanoCT and microCT measurements, R1-Shadow, enables fast and intuitive correction of rotary stage inaccuracies and CT data registration, and is suitable for applications such as dual-energy CT or 4D CT. R1-Shadow is a versatile solution suited to variable field-of-view (FOV) constraints and high-precision requirements.
Specifications
| Type | Pattern layout | Pattern specifications | Absorber type and thickness |
| Hybrid nano-resolution test target |  | Minimum feature 10 nm | 100nm Ir, or higher Au |
| 3D Siemens star resolution test card |  | Minimum feature size less than 200nm | Structure height 200µm, dimension Fhi 100µm |
| Micro-CT resolution test card (click for details) |  | Layout consists of nested L-shapes with line widths: 50 –40 –30 –20 –15 –10 –9 –8 –7 -6 -5 –4 –3 -2 –1.5 -1 –0.9 -0.8 -0.7 –0.6 -0.5 –0.4 /0.3 /0.2 /0.1 (µm) | |
| Yxlon standard micron-resolution test card (click for details) |  | 5.0, 4.0, 3.2, 2.5, 2.0, 1.6, 1.3, 1.0, 0.9, 0.8, 0.7, 0.6, 0.5, 0.45, 0.4, 0.35, 0.3 µm line pairs | 3 µm high gold |
| Multifunctional resolution test card with square apertures/slit patterns (click for details) |  | External dimensions: 1 x 1 cm² including 23 square openings (within red box A, 5x5 µm² ~ 1000x1000 µm²) and two rectangular slit structures in the upper left corner (within red box B) Substrate: 2.5 µm Ti (partially removable if required) | 25 µm thick gold |
| NanoXSpot resolution test card (EN13543 -6 and -4/-7 standards, for testing the focal spot size of micro/nano X-ray sources) (click for details) |  | 4-quadrant area, each quadrant 4 mm x 4 mm, containing two modified Siemens stars, hole arrays (minimum hole diameter 5 microns), and 7 groups of line pairs with different orientations (12 µm, 10 µm, 8 µm, 6 µm, 5 µm, 4 µm, and 3 µm) | 8 µm high gold |
| Micro/nano CT resolution test phantom (click for details) |  | Sphere diameters: 0.5, 1.0, 2.5, 5.0 mm; < 1 μm to > 10 μm voxel sizes for CT applications per ASTM E1695-95 standard | Ruby |
| Nano-CT voxel calibration phantom (click for details) |  | Ball diameter: 0.3 mm; ball spacing: 0.45 mm (certified accuracy: 0.06 μm); <1 μm voxel CT application | Ruby |
| Micro/nano-CT turntable wobble correction sample holder (click for details) |  | Reference dimensions [µm]: 25 25 50 100; suitable for Dual-Energy CT or 4D CT | Ruby |
