X-ray Nano-Imaging Test Target (0.01-4 μm)

Spatial resolutionis an important performance indicator of X-ray imaging image quality, and its testing is also an important part of the performance testing of X-ray imaging equipment. The line-pair card method, which uses a line-pair test card to directly test spatial resolution, is widely used in the testing of spatial resolution in practical industrial CT or synchrotron radiation-based X-ray imaging systems due to its convenience and simplicity.For scanning X-ray microscopy based on synchrotron radiation, coherent diffraction imaging (CDI), or even ptychographic coherent diffraction imaging (PTY), the imaging resolution can be as low as a few nanometers.

Explore unparalleled precision with our X-ray nano-imaging test targets (2D Resolution Test Target) designed for high-precision testing tasks. With a base structure optimized for Gold, our targets provide resolution from 4 μm down to 50 nm, ensuring outstanding detail. We also offer Iridium structures down to 10 nm upon request to meet the demands of those seeking extremely high precision. Through the convergence of advanced design and meticulous nanofabrication, our test targets can enhance your imaging progress.

We offer the following specifications to meet your specific experimental requirements:

• 50 nm Au: Pure gold structure, providing precise, high-resolution imaging.

•30 nm Au/Ir Hybrid: Hybrid material enhances detail.

•20 nm Au/Ir Hybrid: Ultra-fine structures for special imaging needs.

•10 nm Au/Ir Hybrid structure: Our most precise structures for those pushing the limits of nanoscale imaging.

Pattern layout

Cross-sectional view