Hybrid pixel detector technology was originally developed to meet the particle tracking requirements of the Large Hadron Collider (LHC) at CERN. Researchers from CERN and several external collaborating groups saw the opportunity to transfer hybrid pixel detector technology to applications beyond high-energy physics, and thus the Medipix1 Collaboration was born. The Medipix series is a family of pixel detector readout chips developed by the Medipix Collaborations for particle imaging and detection. The Timepix series evolved from the Medipix series, with Timepix chips being more specifically designed for the detection of individual particles to obtain information such as time, trajectory, and energy.

Currently, detectors based on Timepix and Timepix3 are widely used in fields such as electron backscatter diffraction (EBSD) and 4D scanning electron microscopy (4D SEM), owing to their single-electron sensitivity, high dynamic range, and unique event-driven mode.

Advacam, a Czech company, is a full-industry-chain enterprise covering sensor fabrication, microelectronic packaging, hybrid pixel detectors (Timepix, Medipix), and solutions, dedicated to developing imaging solutions for industrial and academic needs.

The ADVAPIX TPX3F and MINIPIX TPX3F series are versatile detectors based on the Timepix3 chip. Their detectors and readout are connected via flexible flat cables, making the overall design very compact and cost-effective. They are highly suitable for electron microscope manufacturers to conduct secondary development and integrate into existing systems to enhance system performance.

The MINIPIX TPX3F detector is used to discriminate electrons, protons, alpha particles, and muons.

Thermo Scientific's™ Helios™ 5 UX DualBeam incorporates Advacam's detection technology.

The new Thermo Scientific Helios 5 DualBeam delivers the industry-leading high-performance imaging and analysis capabilities of the Helios DualBeam product family. It is specifically designed to meet the needs of materials science researchers and engineers for a variety of focused ion beam scanning electron microscopes (FIB-SEM) - even for the most challenging samples.

The Helios 5 DualBeam redefines the standard for high-resolution imaging: high material contrast, fast, simple and precise high-quality sample preparation (for S/TEM imaging and atom probe tomography (APT)) as well as high-quality subsurface and 3D characterization. The new Helios 5 DualBeam builds on the proven capabilities of the Helios DualBeam series with improvements and optimizations designed to ensure optimal system performance in both manual and automated workflows.