Hardware ProductsDetectorEUV/SXR/X-Ray DetectorSilicon Drift X‑ray Fluorescence SpectrometerSilicon Drift X-ray Spectrometer for Laboratory and Scientific Research (XRS)
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Silicon Drift X-ray Spectrometer for Laboratory and Scientific Research (XRS)

Suitable for applications requiring X-ray energy spectrum measurement, such as X-ray fluorescence analysis in industry and laboratories.

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Introduction

The XRS is a complete X-ray energy-dispersive spectroscopy system, consisting of a detector probe, power supply, and DDP. It is well suited for industrial and laboratory X-ray fluorescence analysis and other applications requiring X-ray energy spectrum measurement. Pre-adjusted system parameters combined with the correct selection of SDD module type enable optimal performance and reliability in specific application areas.

Features & Advantages

1High-resolution detector system used with digital pulse processor (DPP) or analog shaper.
2XRF window options: open module (OM), ultra-thin window (UTW), beryllium, or planar thin window (PTW) for detecting light elements down to Li.
3Vacuum-sealed detector nose for easy adaptation to vacuum chambers.
4Second Peltier for improved heat dissipation at higher temperatures.
5Pressure and temperature monitoring for fully controllable SDD module conditions, and getter reactivation option to extend module vacuum lifetime.

Specifications

Effective detection area10-30 mm2
Energy resolution125-129 eV FWHM @Mn-Ka，-30°
Vacuum seal integrity<0.01 mbar
Window materialBE, PTW (low-energy applications)


XRS-The XRF Detector System parameters

Transmittance of different types of planar thin windows for the XRS X-ray spectrometer


Schematic diagram of the functional structure of the XRS X-ray spectrometer detection head


Energy resolution under different chip cooling conditions


Performance of light-element detectors using PTW windows down to C

General Parameters

Active Detection Area
10-30 mm2
Energy Resolution
125-129 eV FWHM @Mn-Ka，-30°
Vacuum tightness
<0.01 mbar
Window material
Be, PTW (low-energy applications)

Typical Applications

  • X-ray fluorescence analysis
  • X-ray energy spectrum measurement

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