The new Incoatec Microfocus Source
... Highest Brilliance ... Intelligent ... Approved Quality and Convenience ...
With its outstanding performance the new Incoatec Microfocus Source
IμSHigh Brillianceraises the standard of low-maintenance sealed tube
solutions for crystallography. Compared to the classic IμS,
the IμSHigh Brilliance shows an increase in intensity of about 30 % for Cu, 50 %
for Ag and 60 % for Mo (Fig 1). The IμSHigh Brilliance perfectly matches the
new Bruker D8 crystallography solutions (Fig 2).
What´s new? The improved optical design makes it possible to produce more photons in the same small
spot. Tried and trusted, our state-of-the-art Quazar multilayeroptics are ideal for 2-dim focusing or
collimating. Of course, the IμSHigh Brilliance includes all familiar advantages of our previous IμS systems:
air-cooling, no movingparts, long lifetime without maintenance (3 years warranty). Furthermore, memory
chips are built into tube, tube mount and optics, recording the real-time status of the
components ("DAVINCI" design). These data allow for easier installation and change of components, and can
be assessed online, making remote diagnostics faster,
better and easier. The result is an absolutely reliable system. The IμS fulfills highest safety standards:
radiation safe, vacuum tested and fully compliant with Machinery
The IµSHigh Brilliance and its new, fully redesigned HV generator IG350 (left). Further LEDs, a new lamp
design and improved safety features are typically for the tube housing of the new IµS (middle). Integrated
memory chips store information provided by the manufacturer and during use (right).
With a peak flux density of more than 2*109 photons/(s mm2) the Mo-IμSHigh Brilliance enables scientists in
small molecule and highresolution crystallography to collectbetter data sets in shorter time. Measurements in
the Incoatec Application Lab with a Bruker D8 show an increase of more than 60 % in the diffracted intensity.
Two data sets (left) with statistics of an Ylid crystal (C11H10O2S, 0.16 x 0.12 x 0.12 mm3, 2s/0.5° exposure
time, h0l layer) ) and section of the diffaction pattern (right)of the Ylid crystal recorded with anIμSHigh Brilliance (above) and a classic IμS (below).
The compact design makes the IμSHigh Brilliance an attractive component for many academic and industrial
research organizations to upgrade existing X-ray analyticalinstruments to cutting-edge performance.