ePix® Timepix3 直接探测电子相机
特点优势：• Single electron sensitivity• Large solid angle in a very small package• High spatial resolution• Ultra-fast read out• Energy thresholding
ePix®是一款基于Timepix3芯片的混合像素探测器，用于电子显微镜，可实现实时直接电子探测。ePix®使用数据驱动的读出模式，每个电子都被分配一个包含精确位置和能量信息的时间戳。与间接电子探测相比，ePix®的动态范围几乎不受限制，在低能段的灵敏度提高了几个数量级。ePix®将高性能读出架构与创新、坚固的探测器设计相结合，为高通量，高分辨率和高灵敏度电子显微镜应用创造了终极探测器解决方案。
特点优势：
• 单电子灵敏度
• 小面积，大立体角
• 高空间分辨率
• 超高速读出
• 能量阈值
CMOS technology | 130 nm |
Pixel size | 55 × 55 μm |
Pixel matrix | 256 × 256 |
Sensitive area | 14 × 14 mm |
Sensor material / types | Si / 100, 300, 500 μm |
TOA resolution | 1.56 ns |
Hit rate in Data-driven mode | 64 Mhit/s |
Energy range | 2.5—300 keV |
Readout | USB-C |
Typical power consumption | 3.5 W |
Readout modes | Data-driven zero-suppressed Frame based zero-suppressed |
Pixel mode of operation | simultaneous Time-Over-Threshold and Time-Of-Arrival or integral Time-Over-Threshold and event count |
Extended front-end | 69 mm × 28 mm × 16 mm |
dimensions | |
Read out dimensions | 104 mm × 67 mm × 30 mm |
Detector mounting | Customizable |
External synchronization | LVDS signals꞉ Trigger In, Trigger Out, Clock In, Clock Out, Ready In, Ready Out |
Front-end to Readout distance | up to 45 cm |
Temperature stabilized | Peltier cooled |
• (4D) STEM in SEM/TEM
• μED (micro electron diffraction)
• EBSD
• EELS
• Micro/nano CT
• Ptychography
The diffraction pattern measured for
Si sample aligned to [100] zone axis.
ePix EFE Product Sheet, standard-众星联恒.pdf
ePIX Timepix3 datasheet v1 from 1_24 _众星联恒.pdf