极紫外/X射线菲涅尔波带片

泽尼克相衬全场X射线显微成像套件

描述全场透射x射线显微镜光学-光束整形condensers,菲涅耳波带片和泽尼克相位环的组合-材料选择:Au, Ir

描述


全场透射x射线显微镜光学系统


-光束整形condensers,菲涅耳波带片和泽尼克相位环的组合


-材料选择:Au, Ir




典型参数:


大的视场 :              ~80-100微米

长的工作距离:        >50mm

分辨率:                  50-100nm

E=6-13 KeV            Zernike PC



发表文章:


I. Vartiainen et al. Halo suppression in full field X-ray Zernike phase contrast microscopy Optics Letters 39 (2014) p. 1601


M. Stampanoni et al. Hard X-ray 3D phase-contrast nanoimaging Physical Review B 81 (2010) p. 140105


I. Vartiainen et al. Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy Optics Express 23 (2015) p. 13278


I. Vartiainen et al. Zernike X-ray Ptychography Optics Letters 41 (2016) p. 721


M. Storm et al. The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences Powder Diffraction (2020) p. 1


Storm M, Döring F, Marathe S, et al. Optimizing the energy bandwidth for transmission full-field X-ray microscopy experiments[J]. Journal of Synchrotron Radiation, 2022, 29(1): 138-147.


典型参数:


大的视场:~80-100微米

长的工作距离:>50mm

分辨率:50-100nm

E=6-13 KeV    Zernike PC



  • 全场透射x射线显微镜光学





发表文章:


I. Vartiainen et al. Halo suppression in full field X-ray Zernike phase contrast microscopy Optics Letters 39 (2014) p. 1601


M. Stampanoni et al. Hard X-ray 3D phase-contrast nanoimaging Physical Review B 81 (2010) p. 140105


I. Vartiainen et al. Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy Optics Express 23 (2015) p. 13278


I. Vartiainen et al. Zernike X-ray Ptychography Optics Letters 41 (2016) p. 721


M. Storm et al. The Diamond I13 full-field transmission X-ray microscope: a Zernike phase-contrast setup for material sciences Powder Diffraction (2020) p. 1



首页
产品
新闻
联系